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Dimensional metrology / Han Haitjema and Richard Leach.

By: Contributor(s): Publisher: Boca Raton, FL ; Abingdon, Oxon : CRC Press, 2025Copyright date: Boca Raton, FL CRC Press, 2025.Edition: First editionDescription: xi, 334p.: il. charts and diagramsContent type:
  • text
Media type:
  • unmediated
Carrier type:
  • volume
ISBN:
  • 9780367420925
  • 9781041070474
Subject(s): DDC classification:
  • 389/.1 23/eng/20250625
LOC classification:
  • QC88 .H257 2025
Summary: "This book provides in-depth coverage of metrology principles for students, practicing engineers, technologists, and researchers. It presents and explains mathematical principles and treatments and practical applications of metrology, with numerous chapter exercises that link theory to the solution of practical problems. Computer-based classes of dimensional metrology are covered, such as CMM-technology, areal surface measurement, and X-ray computed tomography. Readers are shown how to perform and evaluate dimensional measurements and interpret the results. Measuring instruments and methods are explained so readers can determine which to use for specific applications"-- Provided by publisher.
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Holdings
Item type Current library Call number Status Date due Barcode Item holds
Books Books NILE UNIVERSITY OF NIGERIA - MAIN LIBRARY QC 88 .H25 2025 (Browse shelf(Opens below)) Available
Total holds: 0

Includes index.

"This book provides in-depth coverage of metrology principles for students, practicing engineers, technologists, and researchers. It presents and explains mathematical principles and treatments and practical applications of metrology, with numerous chapter exercises that link theory to the solution of practical problems. Computer-based classes of dimensional metrology are covered, such as CMM-technology, areal surface measurement, and X-ray computed tomography. Readers are shown how to perform and evaluate dimensional measurements and interpret the results. Measuring instruments and methods are explained so readers can determine which to use for specific applications"-- Provided by publisher.

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