Wang, Xiaolei <br/><br/>
MOS interface physics, process and characterization 

 - Boca Raton  CRC Press  2022 
 - viii, 161p.: ill. 
<br/><br/><label>ISBN: </label>9781032106281 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metal oxide semiconductors--Design and construction--Mathematics. Semiconductors--Junctions. Integrated circuits--Research. Solid state physics--Experiments.
<br/><br/><label>LC Class. No.: </label>TK 787.99 .M44 .W36/