TY  - BOOK
AU  - Wang, Xiaolei
TI  - MOS interface physics, process and characterization
SN  - 9781032106281
AV  - TK 787.99 .M44 .W36/ 
CY  - Boca Raton
KW  - Metal oxide semiconductors--Design and construction--Mathematics. Semiconductors--Junctions. Integrated circuits--Research. Solid state physics--Experiments
ER  -