TY  - GEN
AU  - Haitjema,Han
AU  - Leach,R.K.
TI  - Dimensional metrology
SN  - 9780367420925
AV  - QC88 .H257 2025
U1  - 389/.1 23/eng/20250625
PY  - 2025///
CY  - Boca Raton, FL, Abingdon, Oxon
PB  - CRC Press
KW  - Metrology
KW  - Measurement
N1  - Includes index
N2  - "This book provides in-depth coverage of metrology principles for students, practicing engineers, technologists, and researchers. It presents and explains mathematical principles and treatments and practical applications of metrology, with numerous chapter exercises that link theory to the solution of practical problems. Computer-based classes of dimensional metrology are covered, such as CMM-technology, areal surface measurement, and X-ray computed tomography. Readers are shown how to perform and evaluate dimensional measurements and interpret the results. Measuring instruments and methods are explained so readers can determine which to use for specific applications"--
ER  -