| 000 | 00460nam a2200181Ia 4500 | ||
|---|---|---|---|
| 005 | 20250423100910.0 | ||
| 008 | 250422s9999 xx 000 0 und d | ||
| 020 | _a0471511048 | ||
| 050 | _aQC 611 .S335/ | ||
| 100 | _aSchroder, Dieter K. | ||
| 245 | 0 | _aSemiconductor material and device characterization | |
| 260 | _aNew York | ||
| 260 | _bWiley | ||
| 260 | _c1990 | ||
| 300 | _a599 p | ||
| 650 | _aSemiconductors Semiconductors_Testing | ||
| 942 | _cBK | ||
| 999 |
_c34677 _d34677 |
||