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MOS interface physics, process and characterization

Wang, Xiaolei

MOS interface physics, process and characterization - Boca Raton CRC Press 2022 - viii, 161p.: ill.

ISBN: 9781032106281

Subjects--Topical Terms:
Metal oxide semiconductors--Design and construction--Mathematics. Semiconductors--Junctions. Integrated circuits--Research. Solid state physics--Experiments.

LC Class. No.: TK 787.99 .M44 .W36/

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