MOS interface physics, process and characterization (Record no. 32772)

MARC details
000 -LEADER
fixed length control field 00603nam a2200181Ia 4500
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9781032106281
050 ## - CALL MARK
Classification number TK 787.99 .M44 .W36/
100 ## - STATEMENT OF RESPONSIBILITY--MAIN AUTHOR NAME
Personal name Wang, Xiaolei
245 #0 - TITLE STATEMENT
Title MOS interface physics, process and characterization
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication Boca Raton
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Name of publisher CRC Press
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Year of publication 2022
300 ## - PHYSICAL DESCRIPTION
Number of Pages viii, 161p.: ill.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Metal oxide semiconductors--Design and construction--Mathematics. Semiconductors--Junctions. Integrated circuits--Research. Solid state physics--Experiments.
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Books
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Permanent Location Current Location Shelving location Date acquired Accession Number Price effective from Koha item type
    Library of Congress Classification     NILE UNIVERSITY OF NIGERIA - MAIN LIBRARY NILE UNIVERSITY OF NIGERIA - MAIN LIBRARY Items on shelf 04/23/2025 0198534 04/23/2025 Books