Dimensional metrology / Han Haitjema and Richard Leach.

By:

Haitjema, Han [author.]

Contributor(s):

Leach, R. K [author.]

Publisher: Boca Raton, FL ; Abingdon, Oxon : CRC Press, 2025Copyright date: Boca Raton, FL CRC Press, 2025.Edition: First editionDescription: xi, 334p.: il. charts and diagramsContent type:

text

Media type:

unmediated

Carrier type:

volume

ISBN:

9780367420925
9781041070474

Subject(s):

DDC classification:

389/.1 23/eng/20250625

LOC classification:

QC88 .H257 2025

Summary: "This book provides in-depth coverage of metrology principles for students, practicing engineers, technologists, and researchers. It presents and explains mathematical principles and treatments and practical applications of metrology, with numerous chapter exercises that link theory to the solution of practical problems. Computer-based classes of dimensional metrology are covered, such as CMM-technology, areal surface measurement, and X-ray computed tomography. Readers are shown how to perform and evaluate dimensional measurements and interpret the results. Measuring instruments and methods are explained so readers can determine which to use for specific applications"-- Provided by publisher.

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Books	NILE UNIVERSITY OF NIGERIA - MAIN LIBRARY	QC 88 .H25 2025 (Browse shelf(Opens below))	Available

Total holds: 0

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Previous	QC 21.3 .Y68 Sears and Zemansky's University physics	QC 23 .K398 1993 Physics /	QC 23 .S37 1964 Complete university physics	QC 88 .H25 2025 Dimensional metrology /	QD 31.2 .C58 2000 Advanced chemistry	QD 31.3 .C43145 2006 Chemistry : the central science	QD 31.3 .E22 2002 General chemistry /	Next

Includes index.

"This book provides in-depth coverage of metrology principles for students, practicing engineers, technologists, and researchers. It presents and explains mathematical principles and treatments and practical applications of metrology, with numerous chapter exercises that link theory to the solution of practical problems. Computer-based classes of dimensional metrology are covered, such as CMM-technology, areal surface measurement, and X-ray computed tomography. Readers are shown how to perform and evaluate dimensional measurements and interpret the results. Measuring instruments and methods are explained so readers can determine which to use for specific applications"-- Provided by publisher.

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